期刊
JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE
卷 26, 期 12, 页码 5877-5884出版社
SPRINGER
DOI: 10.1007/s11665-017-3008-9
关键词
additive manufacturing; scanning laser epitaxy (SLE); nickel-base superalloys; optical microscopy; x-ray diffraction; electron microscopy; Vickers microhardness
资金
- Office of Naval Research as part of the Cyber-enabled Manufacturing Systems (CeMS) program [N00014-11-1-0670]
Epitaxial CMSX-4(A (R)) deposition is achieved on CMSX-4(A (R)) substrates through the scanning laser epitaxy (SLE) process. A thorough analysis is performed using various advanced material characterization techniques, namely high-resolution optical microscopy, scanning electron microscopy, energy-dispersive x-ray spectroscopy, x-ray diffraction, and Vickers microhardness measurements, to characterize and compare the quality of the SLE-fabricated CMSX-4(A (R)) deposits to the CMSX-4(A (R)) substrates. The results show that the CMSX-4(A (R)) deposits have smaller primary dendritic arm spacing, finer gamma/gamma' size, weaker elemental segregation, and higher microhardness compared to the investment cast CMSX-4(A (R)) substrates. The results presented here demonstrate that CMSX-4(A (R)) is an attractive material for laser-based AM processing and, therefore, can be used in the fabrication of gas turbine hot-section components through AM processing.
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