期刊
JOURNAL OF LUMINESCENCE
卷 191, 期 -, 页码 88-91出版社
ELSEVIER
DOI: 10.1016/j.jlumin.2016.10.017
关键词
Cerium; Silicon nanocrystals; Silicates; Photonics; Photoluminescence; Atom probe tomography
类别
资金
- Region Haute-Normandie
Cerium doped SiOx (0 < x < 2) thin films have emerged as promising materials for future Si-based blue light emitting devices. The optical properties of these films are strongly dependent on the nanoscale structure such as the spatial distribution of the Ce atoms. These issues have remained difficult to observe in practice by conventional techniques. In this work, we propose to use atom probe tomography which has emerged as a unique technique that is able to provide information about the chemical composition of the films together with a 3D map indicating the position of each atom from a specimen. Ce-doped SiO1.5 thin films fabricated by evaporation were investigated. The effect of Ce-content has been systematically studied in order to correlate the structure at the nanoscale with the optical properties measured by photoluminescence spectroscopy. (C) 2016 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据