Decisive Structural and Functional Characterization of Halide Perovskites with Synchrotron

Halide perovskites have emerged as a new class of inorganic-based soft semiconductors that are revolutionizing the field of (opto) electronics. However, the fundamental structures and properties or functions of halide perovskites are still far from being fully understood, calling for the need of precise, quantitative, and high-spatiotemporal-resolution characterizations. As one of the most powerful multimodal characterization techniques, synchrotron radiation offers high-brilliance X-ray beams for high-resolution observations across multiple length scales obtained within extremely short time spans. Performing a brief review of synchrotron-based perovskite studies in the literature, here we provide perspectives on the use of synchrotron characterizations not only for studying multiple-length-scale structures and dynamic variations of perovskite materials, but also for in situ monitoring of device functions and dynamics. The goal of this perspective is to present many capabilities and evoke emerging opportunities of synchrotron characterizations for providing decisive answers to the outstanding science problems in the perovskite field, pushing forward the technological development.