4.6 Article

Growth and characterization of MnGa thin films with perpendicular magnetic anisotropy on BiSb topological insulator

期刊

JOURNAL OF APPLIED PHYSICS
卷 122, 期 14, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.4999617

关键词

-

资金

  1. MEXT [16K14228, 12025014 (F-17-IT-0011)]
  2. Grants-in-Aid for Scientific Research [16K14228] Funding Source: KAKEN

向作者/读者索取更多资源

We report on the crystal growth as well as the structural and magnetic properties of Bi0.8Sb0.2 topological insulator (TI)/MnxGa1-x bi-layers grown on GaAs(111) A substrates by molecular beam epitaxy. By optimizing the growth conditions and Mn composition, we were able to grow MnxGa1-x thin films on Bi0.8Sb0.2 with the crystallographic orientation of Bi0.8Sb0.2(001)[1 (1) over bar 0]//MnGa (001)[ 100]. Using magnetic circular dichroism (MCD) spectroscopy, we detected both the L1(0) phase (x < 0.6) and the D0(22) phase (x > 0.6) of MnxGa1-x. For 0.50 <= x <= 0.55, we obtained ferromagnetic L1(0)-MnGa thin films with clear perpendicular magnetic anisotropy, which were confirmed by MCD hysteresis, anomalous Hall effect as well as superconducting quantum interference device measurements. Our results show that the BiSb/MnxGa1-x bi-layer system is promising for perpendicular magnetization switching using the giant spin Hall effect in TIs. Published by AIP Publishing.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据