期刊
JOURNAL OF APPLIED PHYSICS
卷 121, 期 24, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4990284
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资金
- Deutsche Forschungsgemeinschaft [DFG BR1960/7-1]
Thin layers of MnSi, the first discovered host material of a skyrmion lattice, are epitaxially grown on Si(111) and their crystal properties are investigated by X-ray diffraction and transmission electron microscopy (TEM) measurements. Azimuthal phi-scans of asymmetric X-ray reflections reveal the formation of twinned domains with their unit cell rotated +/- 30 degrees in plane with respect to the Si unit cell. The intensities of corresponding reflections indicate the same volume fractions for both domain types. Cross-sectional TEM confirms the presence of these domains and reveals a typical domain size of about 200 nm. Published by AIP Publishing.
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