期刊
PHYSICAL REVIEW B
卷 101, 期 13, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.101.134430
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资金
- NSF [DMR-1708287]
- SMART - nCORE, a Semiconductor Research Corporation program - NIST
- DOE [DE-SC0014388]
- Vannevar Bush Faculty Fellowship (ONR) [N00014-15-1-2845]
- NSF through the MRSEC program
We report on broadband ferromagnetic resonance linewidth measurements performed on epitaxial Heusler thin films. A large and anisotropic two-magnon scattering linewidth broadening is observed for measurements with the magnetization lying in the film plane, while linewidth measurements with the magnetization saturated perpendicular to the sample plane reveal low Gilbert damping constants of (1.5 +/- 0.1) x 10(-3), (1.8 +/- 0.2) x 10(-3), and <8 x 10(-4) for Co2MnSi/MgO, Co2MnAl/MgO, and Co2FeAl/MgO, respectively. The in-plane measurements are fit to a model combining Gilbert and two-magnon scattering contributions to the linewidth, revealing a characteristic disorder length scale of 10-100 nm.
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