期刊
JOURNAL OF SEMICONDUCTORS
卷 41, 期 5, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1674-4926/41/5/051204
关键词
halide perovskites; X-ray detection; optoelectronic materials
Halide perovskites have emerged as the next generation of optoelectronic materials and their remarkable performances have been attractive in the fields of solar cells, light-emitting diodes, photodetectors, etc. In addition, halide perovskites have been reported as an attractive new class of X-ray direct detecting materials recently, owning to the strong X-ray stopping capacity, excellent carrier transport, high sensitivity, and cost-effective manufacturing. Meanwhile, perovskite based direct X-ray imagers have been successfully demonstrated as well. In this review article, we firstly introduced some fundamental principles of direct X-ray detection and imaging, and summarized the advances of perovskite materials for these purposes and finally put forward some needful and feasible directions.
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