期刊
INTERNATIONAL JOURNAL OF PHOTOENERGY
卷 2017, 期 -, 页码 -出版社
HINDAWI LTD
DOI: 10.1155/2017/8479487
关键词
-
资金
- Govan Mbeki Research and Development Centre at the University of Fort Hare
- National Research Foundation of South Africa
- Eskom
Saturation current (I-0) and ideality factor (n) of a p-n junction solar cell are an indication of the quality of the cell. These two parameters are usually estimated from dark current-voltage measurements. In this study, a quick and easy method to determine these two parameters by measuring open-circuit, V-oc, and short-circuit current, I-sc, is presented. Solar cell designers can use this method as a grading or diagnostic tool to evaluate degradation in photovoltaic (PV) modules. In order to verify the V-oc-I-sc method, a series of experiments have been conducted on a single cell and a 36-cell module. Good agreement between our V-oc-I-sc method and dark I-V measurements was obtained. An application of the method on the performance degradation of a single-junction a-Si:H module revealed that the module's I0 increased by more than three orders of magnitude and n increased by 65% after an outdoor exposure of 130 kWh/m(2). This increase in n indicates that after exposure, the recombination current in the cells' space charge region increased due to the light-induced formation of metastable defects. The method is also used to assess the quality of five PV module technologies and proved to be reliable despite defective cells in a module.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据