4.5 Review

Operational stability of perovskite light emitting diodes

期刊

JOURNAL OF PHYSICS-MATERIALS
卷 3, 期 1, 页码 -

出版社

IOP Publishing Ltd
DOI: 10.1088/2515-7639/ab60c4

关键词

perovskite light emitting diodes; stability; degradation mechanisms; ion migration

资金

  1. National Science Foundation DMREF Program (NSF) [1729383]
  2. UNC Research Opportunities Initiative Center for Hybrid Materials Enabled Electronic Technologies (CHMEET)
  3. Direct For Mathematical & Physical Scien
  4. Division Of Materials Research [1729383] Funding Source: National Science Foundation

向作者/读者索取更多资源

Organometal halide perovskite light emitting diodes (LEDs) have attracted a lot of attention in recent years, owing to the rapid progress in device efficiency. However, their short operational lifetime severely impedes the practical uses of these devices. The operating stability of perovskite LEDs are due to degradation due to ambient environment and degradation during operation. The former can be suppressed by encapsulation while the latter one is the intrinsic degradation due to the electrochemical stability of the perovskite materials. In addition, perovskites also suffer from ion migration which is a major degradation mechanism in perovskite LEDs. In this review, we specifically focus on the operational stability of perovskite LEDs. The review is divided into two parts: the first part contains a summary of various degradation mechanisms and some insight on the degradation behavior and the second part is the strategies how to improve the operational stability, especially the strategies to suppress ion migration. Based on the current advances in the literature, we finally present our perspectives to improve the device stability.

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