期刊
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
卷 65, 期 12, 页码 5113-5122出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2017.2765326
关键词
GaN high-electron mobility transistors (HEMTs); large-signal modeling; scalable; surface-potential; trapping effects; zone division
资金
- National Natural Science Foundation of China [61474020]
- China Postdoctoral Science Foundation [2015M570774, 2016T90844]
- National Key Project of Science and Technology
This paper presents an accurate quasi-physical compact large-signal model for GaN high electron mobility transistors (HEMTs). The drain current I-ds expression is acquired by combining the zone division method and the surface potential theory. The proposed I-ds model only contains 19 empirical parameters, with self-heating, ambient temperature and trapping effects considered. The self-heating effects are modeled by a polynomial function of temperature and gate voltage for the critical electric field E-c. And the ambient temperature effects are modeled by modifying pinchoff voltage and maximal electron saturated velocity. The trapping effects are considered with an effective gate-source voltage method. Moreover, taking the advantage of good physical meaning, the proposed I-ds model is scalable. In house 0.15-mu m GaN HEMTs with different sizes are used to validate the model by dc I-V over a wide ambient temperature range, pulsed I-V, multibias S-parameters up to 50 GHz and multibias large-signal characteristics at f(0) = 30 GHz. The good results show that the proposed quasi-physical zone division model is useful for millimeter-wave GaN HEMTs development and circuit design.
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