期刊
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
卷 64, 期 11, 页码 9032-9042出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIE.2017.2719603
关键词
Driver circuits; electromagnetic interference (EMI); silicon carbide (SiC) MOSFET; switching losses; switching transients
资金
- MINECO (Spain) under the Project CICYT [TRA2016-80472-R]
The trend in power electronic applications is to reach higher power density and higher efficiency. Currently, the wide band-gap devices such as silicon carbide MOSFET (SiC MOSFET) are of great interest because they can work at higher switching frequency with low losses. The increase of the switching speed in power devices leads to high power density systems. However, this can generate problems such as overshoots, oscillations, additional losses, and electromagnetic interference (EMI). In this paper, a novel active gate driver (AGD) for improving the SiC MOSFET switching trajectory with high performance is presented. The AGD is an open-loop control system and its principle is based on gate energy decrease with a gate resistance increment during the Miller plateau effect on gate-source voltage. The proposed AGD has been designed and validated through experimental tests for high-frequency operation. Moreover, an EMI discussion and a performance analysis were realized for the AGD. The results show that the AGD can reduce the overshoots, oscillations, and losses without compromising the EMI. In addition, the AGD can control the turn-on and turn-off transitions separately, and it is suitable for working with asymmetrical supplies required by SiC MOSFETs.
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