期刊
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
卷 9, 期 12, 页码 -出版社
ELECTROCHEMICAL SOC INC
DOI: 10.1149/2162-8777/abc834
关键词
gallium oxide; SBD; Leakage current; Breakdown; Theory and Modelling
资金
- National Research Foundation of Korea (NRF) - Korea government (MSIT) [2020R1A2C1013693]
- Korea Institute for Advancement of Technology (KIAT) - Korea Government (MOTIE) [P0012451]
- National Research Foundation of Korea [2020R1A2C1013693] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
The reverse leakage current under high reverse voltage of a Ni/beta-Ga2O3 Schottky barrier diode (SBD) is numerically modelled and compared to measurements. universal Schottky tunnelling, thermionic emission and image-force lowering were taken into account. Furthermore, when type conversion under high reverse voltage has occurred at the top interface between Ni and beta-Ga2O3 and the SBD behaved as P-i-N diode, band to band tunnelling is proposed in association with the usually used Selberherr's Impact ionization to model avalanche breakdown. The obtained breakdown voltage and specific on-resistance value are 434 V and 2.13 m omega cm(2), respectively, fairly close to measurement values of 440 V and 2.79 m omega cm(2). Optimization is performed based on the insertion of an intrinsic layer between Ni and the beta-Ga2O3 drift layer. It was found that 0.4 mu m gave better Baliga's figure of merit of 9.4810(7) Wcm(-2) with breakdown voltage and specific on-resistance of 465 V and 2.28 m omega cm(2), respectively. Finally, a surface edge termination design based on TiO2 insulator plate is adopted and the best obtained breakdown voltage, Baliga's figure of merit and specific on-resistance were 1466 V, 1.98 x 10(9) Wcm(-2) and 1.98 m omega cm(2) respectively.
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