期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 64, 期 3, 页码 1114-1119出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2016.2645285
关键词
Luminous properties; phosphor-in-glass (PiG); thermal reliability; white light-emitting diodes (WLEDs)
资金
- Major Program of Technological Innovation in Hubei Province [2016AAA069]
- Fundamental Research Funds for the Central Universities [2016JCTD112]
- Open Foundation of State Key Laboratory of Digital Manufacturing Equipment and Technology [DMET 2015019, 2014017]
This paper systematically investigates the luminous properties and thermal reliability of phosphor-in-glass (PiG)-based white light-emitting diodes (WLEDs). The PiG was prepared by introducing yellow YAG:Ce3+ phosphor embedded with borosilicate glass through screen-printing and low-temperature sintering. The effects of sintering temperature, phosphor content, and phosphor layer thickness were studied, and then the optimized PiG was achieved. This PiG-based WLED module yields a luminous efficacy (LE) of 114 lm/W, a correlated color temperature of 5524 K, and a color rendering index of 69 at the driving current of 700 mA. Furthermore, after thermal aging test at 200 degrees C for 500 h, the photoluminescence intensity of PiG is only reduced by 4.3%, which is much lower than the conventional phosphor-in-silicone (PiS) of 26.2%. The LE losses of PiG-based and PiS-based WLED modules are 4.2% and 12.1% after thermal aging of 1000 h at 100 degrees C, respectively. The aging results show that the proposed PiG exhibits superior thermal stability characteristic, which promises the excellent thermal reliability for PiG-based WLEDs.
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