期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 64, 期 8, 页码 3494-3497出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2017.2710180
关键词
Falling time; gate driver circuit; hydrogenated amorphous silicon thin-film transistor (a-Si:H TFT); rising time
资金
- Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan, Taiwan
- Ministry of Science and Technology of Taiwan [MOST 105-2218-E-006-009, MOST 104-2221-E-006-189-MY3]
- AU Optronics Corporation
This brief develops a novel hydrogenated amorphous silicon thin-film transistor (a-Si: H TFT) gate driver with short rising and falling times. The driving capability of the a-Si: H device is improved owing to the enlarged gate voltages by the two-step-bootstrapping structure of the proposed gate driver. The measured rising time, falling time, and voltage swing of the output waveform are 2.05 mu s, 1.31 mu s, and 27.1 V, respectively, after an accelerated lifetime test at 70 degrees C for 120 h.
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