4.8 Article

Atomic-Scale Studies of Overlapping Grain Boundaries between Parallel and Quasi-Parallel Grains in Low-Symmetry Monolayer ReS2

期刊

MATTER
卷 3, 期 6, 页码 2108-2123

出版社

CELL PRESS
DOI: 10.1016/j.matt.2020.09.015

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资金

  1. Ministry of Science and Technology of China [2016YFA0200101, 2016YFA0200104]
  2. National Natural Science Foundation of China [51972204]
  3. National University of Defense Technology
  4. Shenzhen Basic Research Project [JCYJ20170407155608882]

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Grain boundaries (GBs) are significant microstructures that dominate properties of polycrystalline two-dimensional (2D) materials. Low-symmetry rhenium disulfide monolayers provide an ideal platform to investigate diverse configurations of GBs and their orientation-dependent characteristics. Here, we utilize the preferential deposition of platinum-based nanoparticles on grain edges to rapidly locate nanoscale-wide overlapping GBs during microscopic-scale observation. Atomic-resolution investigations by aberration-corrected annular dark-field scanning transmission electron microscopy reveal diverse overlapping GBs constructed by parallel grains with transversal displacement. They prefer to align along several primary lattice directions with different interlayer atomic registries. Calculations show that the electronic band structures of overlapping GBs are strongly direction dependent, suggesting their potential in tunable electronic and photonic devices. Incommensurate overlapping GBs formed by quasi-parallel grains with ultrasmall twist angles are also observed. These results unveil the rich polymorphism of GBs and new opportunities to tailor properties of anisotropic 2D materials via GB engineering.

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