期刊
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
卷 27, 期 4, 页码 419-421出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LMWC.2017.2678424
关键词
Gallium nitride; high electron mobility transistors (HEMTs); load-pull measurement; nonlinear vector network analyzer (NVNA); Q-band; thermal effects
资金
- French RENATECH network
- French Defense Procurement Agency (DGA) under Project EDA-EuGaNiC
- Contract FUI-VeGaN
- ANR Project CROCUS
We report on the development of a nonlinear vector network analyzer power measurement setup for on-wafer large signal device characterization up to the Q-band. The setup can be used with various types of load pull (active, passive or hybrid) and enables measurements both in continuous wave and pulsed modes (1- mu s pulsewidth and a duty cycle of 1%). Subsequently, state-of-the-art power results at 40 GHz have been achieved on sub-10 nm barrier AlN/GaN high electron mobility transistors. Pulsed load-pull measurements allowed reaching an output power density at such high frequency above 6 W/mm together with high efficiency up to a drain voltage of 30 V while avoiding self-heating effects and thus gate leakage current degradation.
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