4.6 Article

Novel Superjunction LDMOS (>950 V) With a Thin Layer SOI

期刊

IEEE ELECTRON DEVICE LETTERS
卷 38, 期 11, 页码 1555-1558

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2017.2751571

关键词

Superjunction; T-SJ LDMOS; breakdown voltage (V-B); specific on-resistance (R-on,R- sp); thin layer SOI

资金

  1. National Natural Science Foundation of China [61704020, 61376080, 61474017]
  2. 13th Five-Year Plan for Microelectronics Advanced Research Program [31513030201-2]
  3. Fundamental Research Funds for the Central Universities [ZYGX2017KYQD159]

向作者/读者索取更多资源

A novel superjunction (SJ) lateral double-diffused MOSFET (> 950 V) with a thin layer SOI combining the advantage of low specific on-resistance R-on, (sp) of the SJ and the high breakdown voltage V-B of the thin SOI is proposed and experimentally demonstrated in this letter. Based on our previously developed equivalent substrate model, the optimized SJ endows the device with a respectably reduced R-on,R- sp without sacrificing V-B. Meanwhile, the thin layer SOI is designed with the enhanced dielectric layer field principle to carry out a high V-B. The experimental results exhibit a R-on,R- sp of 145 m Omega.cm(2) with a V-B of 977 V. This represents a reduction in R-on,R- sp by 18.1% when compared with the theoretical R-on,R- sp alpha V-B(2.5) silicon limit.

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