Surface roughness retrieval by inversion of the Hapke model: A multiscale approach

Surface roughness is a key property of soils that controls many surface processes and influences the scattering of incident electromagnetic waves at a wide range of scales. Hapke (2012b) designed a photometric model providing an approximate analytical solution of the Bidirectional Reflectance Distribution Function (BRDF) of a particulate medium: he introduced the effect of surface roughness as a correction factor of the BRDF of a smooth surface. This photometric roughness is defined as the mean slope angle of the facets composing the surface, integrated over all scales from the grain size to the local topography. Yet its physical meaning is still a question at issue, as the scale at which it occurs is not clearly defined. This work aims at better understanding the relative influence of roughness scales on soil BRDF and to test the ability of the Hapke model to retrieve a roughness that depicts effectively the ground truth. We apply a wavelet transform on millimeter digital terrain models (DTM) acquired over volcanic terrains. This method allows splitting the frequency band of a signal in several sub-bands, each corresponding to a spatial scale. We demonstrate that sub-centimeter surface features dominate both the integrated roughness and the BRDF shape. We investigate the suitability of the Hapke model for surface roughness retrieval by inversion on optical data. A global sensitivity analysis of the model shows that soil BRDF is very sensitive to surface roughness, nearly as much as the single scattering albedo according to the phase angle, but also that these two parameters are strongly correlated. Based on these results, a simplified two-parameter model depending on surface albedo and roughness is proposed. Inversion of this model on BRDF data simulated by a ray-tracing code over natural targets shows a good estimation of surface roughness when the assumptions of the model are verified, with a priori knowledge on surface albedo. (C) 2017 Elsevier Inc. All rights reserved.