Microwave dielectric properties and sintering behaviors of Zn1.8SiO3.8 ceramics

Zn2SiO4 ceramics are important candidates for microwave dielectric materials applied in wireless communication. However, the appearance of the second phase and stomatal impurity affect the microwave dielectric properties. In this work, Zn2SiO4 ceramics were prepared by the conventional solid-state process under different temperatures according to Zn-deficient formula to suppress the formation of secondary phase. X-ray diffraction showed peaks that coincide with those of Zn2SiO4 PDF card standard without secondary phase. Scanning electron microscopy revealed that there were uniform crystal grains at 1300 degrees C, and larger grains sizes yielded smaller pore gaps. The dielectric properties of Zn1.8SiO3.8 ceramics sintered at 1300 degrees C were estimated to epsilon(r) = 6.451, Q*f = 102,807 GHz, and tau(f) = -32 ppm/degrees C.(.) In summary, Zn1.8SiO3.8 ceramics had potential applications in wireless communication technology due to their excellent dielectric property.

Automated summary

Zn1.8SiO3.8 ceramics were successfully prepared in this study by controlling the sintering temperature and composition, suppressing the formation of the second phase to obtain Zn2SiO4 ceramics without secondary phase. The ceramics exhibited excellent dielectric properties at 1300 degrees Celsius sintering, making them suitable for wireless communication technology.