4.6 Article

Microstructuring GaAs Using Reverse-Patterning Lithography: Implications for Transistors and Solar Cells

期刊

ACS APPLIED ELECTRONIC MATERIALS
卷 3, 期 1, 页码 170-175

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.0c00876

关键词

reverse patterning lithography; patterned GaAs; microcontact printing; microstructuring; self-assembled monolayers; SAMs

资金

  1. National Science Foundation [CHE-1710561]
  2. Robert A Welch Foundation [E-1320]
  3. Texas Center for Superconductivity at the University of Houston
  4. Advanced Manufacturing Institute at the University of Houston

向作者/读者索取更多资源

Reverse patterning lithography (RPL) combines microcontact printing of a custom-designed fluorinated adsorbate on gallium arsenide (GaAs) and the deposition of a polymeric resin as a wet-etching resist, allowing for the formation of positive patterns on GaAs wafers with various designed shapes and sharp edges at a high lateral resolution and depth, cost-effectively and time-efficiently.
This paper introduces reverse patterning lithography (RPL), which combines microcontact printing (mu CP) of a custom-designed fluorinated adsorbate on gallium arsenide (GaAs) and the deposition of a polymeric resin as a wet-etching resist. Positive patterns were formed on GaAs wafers having various designed shapes and sharp edges at a lateral resolution of 100.0 pm and a depth of up to 3.0 mu m. The RPL method benefits from being cost-effective and time-efficient compared to conventional photo-lithography and has the potential for use in the fabrication of various GaAs devices, including solar cells, light-emitting diodes, and microwave and radio frequency transistors.

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