4.6 Article

Site-dependent photoinduced charge carrier dynamics in nitrogen/fluorine doped TiO2 nanoparticles

期刊

JOURNAL OF MATERIALS CHEMISTRY C
卷 9, 期 6, 页码 1992-2000

出版社

ROYAL SOC CHEMISTRY
DOI: 10.1039/d0tc05063f

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资金

  1. National Research Foundation (NRF) - Korean government (MSIT) [2019R1A6A1A10073079]
  2. Korea Initiative for fostering University of Research and Innovation Program of the National Research Foundation (NRF) - Korean government (MSIT) [2020M3H1A1077095]
  3. POSCO Science Fellowship of POSCO TJ Park Foundation

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The study demonstrates that nitrogen/fluorine doping of TiO2 nanoparticles plays a crucial role in suppressing electron-hole recombination. The trapping of electrons and holes varies depending on the doping site, with different trapping times observed. Nanoparticles doped in different domains exhibit diverse charge recombination pathways.
Nitrogen/fluorine doping of TiO2 nanoparticles (NPs) serves to play an important role with regard to visible light absorption and charge carrier dynamics. However, it is largely unknown how nitrogen/fluorine doping retards electron-hole recombination. We carried out density functional theory and nonadiabatic molecular dynamics to demonstrate that the dopant levels, formation energies, and charge carrier dynamics depend strongly on the doping site. N-doping introduces both a hole and an electron trap without the presence of oxygen vacancies, while F-doping introduces only an electron trap. Quantum dynamics simulations show that holes are trapped within several picoseconds; N-doped NPs requires longer hole-trapping time than F-doped NPs due to the presence of an extra hole trap originating from the N 2p state. Electrons are trapped at a longer time scale than holes. F-doped NPs required longer electron-trapping time due to more strongly localized electron densities than N-doped TiO2 NPs. In general, Nitrogen and fluorine doping suppressed electron-hole recombination compared to pristine NP. NPs doped at the tip domain showed different charge recombination pathways by passing several hole traps (N-doping) or by dual channel routes (F-doping). NPs doped at edge domains showed relatively shorter excited state lifetime due to greater electronic coupling between trapped holes and electrons. NPs with doping at the inside domain effectively suppressed charge recombination due to a moderate energy gap and a reduced propensity to electron/hole localization. The diverse charge recombination scenarios revealed by nonadiabatic molecular dynamics simulations provided guidelines for the rational design of nanoscale metal oxides for solar energy harvesting and utilization.

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