Total reflection X-ray fluorescence analysis of aerosol particles with direct dissolution of the collection filter on a substrate

Determining the amounts of metallic elements in atmospheric aerosols is important for estimating their origin and evaluating their potential effects on human health. In this study, we developed a new method based on total reflection X-ray fluorescence (TXRF) analysis for the characterization of atmospheric aerosols. The filter used to collect the aerosol was placed on a silicon wafer as a sample carrier and dissolved in an aliquot of acetone. The remaining residue, i.e. the dissolved filter paper, was thin; thus, most of the aerosols collected in the filter paper could be measured by the thin X-ray beam. This approach improved the minimum detection limits of the measured target metals, making it possible to measure trace elements in atmospheric aerosols.

Automated summary

A new method based on TXRF analysis was developed in this study to characterize atmospheric aerosols. By dissolving the filter paper in acetone and using a silicon wafer as a sample carrier, measurement of trace elements in atmospheric aerosols was made possible with improved detection limits.