期刊
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
卷 36, 期 3, 页码 570-575出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/d0ja00414f
关键词
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资金
- JSPS KAKENHI [17H03080, 17H01481, 18H01755]
- Grants-in-Aid for Scientific Research [18H01755, 17H01481, 17H03080] Funding Source: KAKEN
A new method based on TXRF analysis was developed in this study to characterize atmospheric aerosols. By dissolving the filter paper in acetone and using a silicon wafer as a sample carrier, measurement of trace elements in atmospheric aerosols was made possible with improved detection limits.
Determining the amounts of metallic elements in atmospheric aerosols is important for estimating their origin and evaluating their potential effects on human health. In this study, we developed a new method based on total reflection X-ray fluorescence (TXRF) analysis for the characterization of atmospheric aerosols. The filter used to collect the aerosol was placed on a silicon wafer as a sample carrier and dissolved in an aliquot of acetone. The remaining residue, i.e. the dissolved filter paper, was thin; thus, most of the aerosols collected in the filter paper could be measured by the thin X-ray beam. This approach improved the minimum detection limits of the measured target metals, making it possible to measure trace elements in atmospheric aerosols.
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