4.7 Article

In Situ Study of the Wet Chemical Etching of SiO2 and Nanoparticle@SiO2 Core-Shell Nanospheres

期刊

ACS APPLIED NANO MATERIALS
卷 4, 期 2, 页码 1136-1148

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsanm.0c02771

关键词

liquid cell electron microscopy; wet chemical etching; silica nanoparticles; imaging conditions; low dose imaging

资金

  1. European Research Council (ERC) via the ERC Consolidator Grant NANO-INSITU [683076]
  2. NWO-TTW Perspectief Program Understanding Processes Using Operando Nanoscopy, project UPON-B3 [14206]
  3. Netherlands Center for Multiscale Catalytic Energy Conversion (MCEC), an NWO Gravitation programme - Ministry of Education, Culture, and Science of the government of the Netherlands

向作者/读者索取更多资源

The recent advancement of liquid cell (scanning) transmission electron microscopy (LC-(S)TEM) enables the study of nanomaterials at the nanoscale in a liquid environment, showing the chemically induced etching of silica nanoparticles can be reliably studied at the single particle level with negligible electron beam effects. Monte-Carlo simulations of electron trajectories during LC-(S)TEM experiments can relate the cumulative electron dose to deposited energy on particles, significantly altering the silica network under imaging conditions. LC-(S)TEM imaging conditions were optimized to systematically characterize the wet etching of silica and metal(oxide)-silica core-shell nanoparticles, reproducing etching patterns of different types of silica particles reported in literature and directly visualizing the formation of yolk-shell structures from wet etching of core-shell nanospheres.
The recent development of liquid cell (scanning) transmission electron microscopy (LC-(S)TEM) has opened the unique possibility of studying the chemical behavior of nanomaterials down to the nanoscale in a liquid environment. Here, we show that the chemically induced etching of three different types of silica-based silica nanoparticles can be reliably studied at the single particle level using LC-(S)TEM with a negligible effect of the electron beam, and we demonstrate this method by successfully monitoring the formation of silica-based heterogeneous yolk-shell nanostructures. By scrutinizing the influence of electron beam irradiation, we show that the cumulative electron dose on the imaging area plays a crucial role in the observed damage and needs to be considered during experimental design. Monte-Carlo simulations of the electron trajectories during LC-(S)TEM experiments allowed us to relate the cumulative electron dose to the deposited energy on the particles, which was found to significantly alter the silica network under imaging conditions of nanoparticles. We used these optimized LC-(S)TEM imaging conditions to systematically characterize the wet etching of silica and metal(oxide)-silica core-shell nanoparticles with cores of gold and iron oxide, which are representative of many other core-silica-shell systems. The LC-(S)TEM method reliably reproduced the etching patterns of Stober, water-in-oil reverse microemulsion (WORM), and amino acid-catalyzed silica particles that were reported before in the literature. Furthermore, we directly visualized the formation of yolk-shell structures from the wet etching of Au@Stober silica and Fe3O4@WORM silica core-shell nanospheres.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据