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Correlating the Density of Trap-States and the Field-Effect Performance in Metal-Oxide Thin-Film Transistors With High-k Gate Dielectrics via a Trap-Limited Conduction Method

IEEE TRANSACTIONS ON NANOTECHNOLOGY (2021)

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Correlating the Density of Trap-States and the Field-Effect Performance in Metal-Oxide Thin-Film Transistors With High-k Gate Dielectrics via a Trap-Limited Conduction Method

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