期刊
FERROELECTRICS
卷 518, 期 1, 页码 42-51出版社
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150193.2017.1360119
关键词
X-ray diffraction; ferroelectricity; ac conductivity
A lead free polycrystalline material Ba(Bi0.5Ta0.5)O-3 was prepared by a standard mixed oxide method using high-purity precursor materials. A preliminary X-ray diffraction study confirmed the formation of a single-phase material, crystallized in monoclinic phase and homogeneous morphology for the sample. The dielectric properties (E-r and tan) have been studied for a wide range of temperature at some selected frequencies. The temperature dependence of relative permittivity suggests that the material may exhibit ferroelectricity of diffuse type around 315 degrees C. The frequency dependence of ac conductivity follows the Jonscher's power lawreveals the material exhibit NTCR behavior similar to that of a semiconductor.
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