4.8 Article

Depth mapping of metallic nanowire polymer nanocomposites by scanning dielectric microscopy

期刊

NANOSCALE
卷 13, 期 22, 页码 10116-10126

出版社

ROYAL SOC CHEMISTRY
DOI: 10.1039/d1nr01058a

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资金

  1. Spanish Ministerio de Economa, Industria y Competitividad
  2. EU FEDER [PID2019-111376RA-I00]
  3. Generalitat de Catalunya [2017-SGR1079]
  4. CERCA Program
  5. European Commission [H2020- MSCA-721874]
  6. Marie Sklodowska-Curie Actions [842402]
  7. European Research Council under the European Union [819417]
  8. European Research Council (ERC) [819417] Funding Source: European Research Council (ERC)
  9. Marie Curie Actions (MSCA) [842402] Funding Source: Marie Curie Actions (MSCA)

向作者/读者索取更多资源

This study demonstrates that Scanning Dielectric Microscopy (SDM) can map the depth distribution of metallic nanowires within polymer nanocomposite materials in a non-destructive way. The researchers were able to determine the spatial distribution of silver nanowires in gelatin films under different ambient conditions. These findings suggest that SDM can be a valuable subsurface characterization technique for optimizing nanowire-based nanocomposite materials for various applications.
Polymer nanocomposite materials based on metallic nanowires are widely investigated as transparent and flexible electrodes or as stretchable conductors and dielectrics for biosensing. Here we show that Scanning Dielectric Microscopy (SDM) can map the depth distribution of metallic nanowires within the nanocomposites in a non-destructive way. This is achieved by a quantitative analysis of sub-surface electrostatic force microscopy measurements with finite-element numerical calculations. As an application we determined the three-dimensional spatial distribution of similar to 50 nm diameter silver nanowires in similar to 100 nm-250 nm thick gelatin films. The characterization is done both under dry ambient conditions, where gelatin shows a relatively low dielectric constant, epsilon(r) similar to 5, and under humid ambient conditions, where its dielectric constant increases up to epsilon(r) similar to 14. The present results show that SDM can be a valuable non-destructive subsurface characterization technique for nanowire-based nanocomposite materials, which can contribute to the optimization of these materials for applications in fields such as wearable electronics, solar cell technologies or printable electronics.

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