Orbital engineering in YVO3-LaAlO3 superlattices

Oxide heterostructures provide unique opportunities to modify the properties of quantum materials through a targeted manipulation of spin, charge, and orbital states. Here, we use resonant x-ray reflectometry to probe the electronic structure of thin slabs of YVO3 embedded in a superlattice with LaAlO3. We extend the previously established methods of reflectometry analysis to a general form applicable to t(2g) electron systems and extract quantitative depth-dependent x-ray linear dichroism profiles. Our data reveal an artificial, layered orbital polarization, where the average occupation of xz and yz orbitals in the interface planes next to LaAlO3 is inverted compared to the central part of the YVO3 slab. This phase is stable down to 30 K and the bulklike orbital ordering transitions are absent. We identify the key mechanism for the electronic reconstruction to be a combination of epitaxial strain and spatial confinement by the LaAlO3 layers, in good agreement with predictions from ab initio theory.

Automated summary

The study uses resonant x-ray reflectometry to investigate the electronic structure of YVO3/LaAlO3 heterostructure, revealing an artificial, layered orbital polarization phenomenon where the occupation of orbitals near LaAlO3 interface planes is reversed compared to the central part of YVO3. This phenomenon is stable down to 30 K and is attributed to a combination of epitaxial strain and spatial confinement by the LaAlO3 layers.