期刊
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
卷 70, 期 -, 页码 -出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2021.3082323
关键词
Amorphous ferromagnetic materials; crystallization processes; current annealing; magnetic labels; microscope
A new microscope stand has been built for measuring properties and characterizing amorphous magnetic materials under electric current, by measuring infrared radiation for temperature determination. The device is useful for detecting crystallization processes and studying crystal growth and grain recrystallization.
In this research, a microscope stand has been built which enables both the measurement of properties and the characterization of amorphous magnetic materials when they are subjected to an electric current. It is currently not possible to ascertain the real temperature during current annealing using a thermocouple, due to the thermal inertia and the fact that its mass is comparable to that of the amorphous material. To solve this, the infrared radiation of the material can be measured during the heating process by means of a microscope. In order to achieve this, it is necessary to place the material under the microscope so that the said radiation value may be obtained whilst avoiding buckling. The stand fulfills this function since it features a sliding part connected to a weight, which enables the measurement of the magnetic properties and the temperature of the amorphous ferromagnetic material using the microscope. The device developed is very useful for detecting crystallization processes in situ and it could also be used to study the growth of monocrystals and the recrystallization of grains.
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