4.7 Article

Uncertainty quantification and estimation in differential dynamic microscopy

期刊

PHYSICAL REVIEW E
卷 104, 期 3, 页码 -

出版社

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevE.104.034610

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资金

  1. BioPACIFIC Materials Innovation Platform of the National Science Foundation [DMR-1933487]
  2. Materials Research Science and Engineering Center (MRSEC) Program of the National Science Foundation [DMR-1720256]
  3. National Science foundation [DMS-2053423, CBET-1729108, CNS-1725797]
  4. California NanoSystems Institute
  5. MRSEC (NSF) at UC Santa Barbara [DMR-1720256]

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Differential dynamic microscopy (DDM) combines scattering sensitivity with microscopy visualization benefits for analyzing dynamical properties of various systems. A statistical analysis was presented to reduce computational cost, enhance robustness, and introduce a new uncertainty quantification method (DDM-UQ). This approach has been validated through simulations and experiments, showing improved accuracy and computational efficiency compared to conventional methods.
Differential dynamic microscopy (DDM) is a form of video image analysis that combines the sensitivity of scattering and the direct visualization benefits of microscopy. DDM is broadly useful in determining dynamical properties including the intermediate scattering function for many spatiotemporally correlated systems. Despite its straightforward analysis, DDM has not been fully adopted as a routine characterization tool, largely due to computational cost and lack of algorithmic robustness. We present statistical analysis that quantifies the noise, reduces the computational order, and enhances the robustness of DDM analysis. We propagate the image noise through the Fourier analysis, which allows us to comprehensively study the bias in different estimators of model parameters, and we derive a different way to detect whether the bias is negligible. Furthermore, through use of Gaussian process regression (GPR), we find that predictive samples of the image structure function require only around 0.5%-5% of the Fourier transforms of the observed quantities. This vastly reduces computational cost, while preserving information of the quantities of interest, such as quantiles of the image scattering function, for subsequent analysis. The approach, which we call DDM with uncertainty quantification (DDM-UQ), is validated using both simulations and experiments with respect to accuracy and computational efficiency, as compared with conventional DDM and multiple particle tracking. Overall, we propose that DDM-UQ lays the foundation for important new applications of DDM, as well as to high-throughput characterization.

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