期刊
2021 IEEE 48TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
卷 -, 期 -, 页码 767-770出版社
IEEE
DOI: 10.1109/PVSC43889.2021.9518728
关键词
bifacial; crystalline silicon; UV photo-degradation; surface passivation; UV exposure
资金
- Durable Modules Materials Consortium (DuraMAT), an Energy Materials Network Consortium - U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, Solar Energy Technologies Office [302509]
Bifacial technology in solar cells offers higher power output and lower levelized cost of energy compared to monofacial counterparts. Testing the adverse effects of ultraviolet-induced degradation on different high-efficiency silicon wafer-based bifacial cell technologies revealed various degrees of power loss and degradation pathways for different cell types.
Bifacial technology enables solar cells to offer higher power output and lower levelized cost of energy compared to their monofacial counterparts. Here, we examined the adverse effects of ultraviolet-induced degradation (UVID) on a variety of high-efficiency silicon wafer-based bifacial cell technologies, including silicon heterojunction (SHJ), interdigitated back contact (IBC), passivated emitter rear contact (PERC), and passivated emitter rear totally-diffused (PERT). Both the front and rear sides of bifacial cells without any encapsulation were exposed to an artificially accelerated UV exposure test. After 2000 h of UV irradiation, the bifacial cells exhibited greater power loss with backside exposure indicating potential sensitivity of the rear passivation to UV. The highest power degradation is observed in SHJ cells, followed by p-PERC and n-PERT cell technologies. The degradation in SHJ cells is attributed to the reduction in V-oc and FF, while the degradation in p-PERC and n-PERT cells is correlated with a significant drop in I-sc. This suggests that each cell type/make degrades via different degradation pathways.
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