期刊
2021 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW)
卷 -, 期 -, 页码 57-60出版社
IEEE
DOI: 10.1109/IIRW53245.2021.9635612
关键词
charging; high-k; hysteresis; traps
The investigation focused on charging damage due to gate antennae on 65nm NMOS devices with a thick 9.5nm HfOx gate dielectric. It was found that charging caused different trap characteristics in plate-antenna and control transistors.
Charging damage due to gate antennae is investigated on 65nm NMOS devices with a thick 9.5nm HfOx gate dielectric. The hysteresis and time sampling of the channel current are considered to evaluate this degradation. Cycles of double-ramp sweeps and reset pulses demonstrate that charging causes different trap characteristics in plate-antenna and control transistors.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据