期刊
出版社
IEEE
DOI: 10.1109/GFP51802.2021.9673977
关键词
Integrated quantum optics; silicon resonators; stimulated emission tomography; photon pair sources
Stimulated Emission Tomography (SET) is a technique to map the Joint Spectral Amplitude (JSA) of photon pairs with high signal to noise ratio and low integration times. Retrieving the Joint Spectral Phase (JSP) is challenging and requires advanced interferometric techniques. This research presents a scheme to measure complex JSA using a reconfigurable silicon chip and maps the rich structure of the JSP of a silicon microresonator.
Stimulated Emission Tomography (SET) is a technique which maps the Joint Spectral Amplitude (JSA) of photon pairs with extremely high signal to noise ratio and low integration times. While the modulus of the JSA is easy to access, the retrieval of the Joint Spectral Phase (JSP) is far more challenging and requires advanced interferometric techniques. Here we present and validate a scheme to measure the complex JSA by using a reconligurable silicon chip. In particular, we map the rich structure of the JSP of a silicon microresonator.
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