3.8 Proceedings Paper

Traceability Chain from Dimensional to Impedance for S parameter Measurement up to Millimeter Wave Frequencies

出版社

IEEE
DOI: 10.1109/SIU53274.2021.9477971

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s parameter; impedance traceability; milimeter waves

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This study focuses on obtaining impedance parameters from dimensional measurements of calculable impedance standards used at high frequencies up to 90 GHz, known as millimeter waves, including future 5G operating frequencies. It also includes an analysis of the effect of uncertainty in dimensional measurements on impedance calculation.
Today, calculable impedance standards are preferred for the verification and traceability of VNAs that measure the most accurate and precise reflection coefficient at high frequencies. In this study, it is included to obtain impedance parameters from dimensional measurements of calculable impedance standards used at frequencies up to 90 GHz, known as millimeter waves, including 5G operating frequencies in the future. The effect analysis of the uncertainty in dimensional measurements on impedance calculation is included in this study.

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