期刊
RSC ADVANCES
卷 12, 期 31, 页码 19695-19702出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/d2ra02868a
关键词
-
资金
- National Chung-Shan Institute of Science & Technology (NCSIST) [NCSIST-0497-V403]
- Ministry of Science and Technology of Taiwan [MOST 110-2221-E-167-001, MOST 110-2622-E-167-006, MOST 109-2221-E-035-019-MY3]
A facial method is developed to reduce the formation of defects during the growth of SiC ingots. The method involves in situ fabricating a graphite layer on a SiC seed crystal, which effectively inhibits the diffusion of Si and loss of Si during the high-temperature growing process, leading to fewer defects in the SiC ingots.
A facial method was developed to in situ fabricate a graphite layer on a SiC seed crystal to reduce the formation of defects during the growth of SiC ingots. The formulated PI matrix combined with an appropriate coupling agent could strongly adhere to SiC and be transformed into protective layers for SiC seed crystals during SiC growth. The thermally conductive graphite layers on SiC effectively reduce the backside diffusion of Si, inhibit the loss of Si from seed crystals during high-temperature growing process, and consequently lead to fewer defects formed in the SiC ingot. The graphitization degree, chemical state, roughness and morphology of films were investigated in this work.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据