4.6 Article

Van Hove singularity and Lifshitz transition in thickness-controlled Li-intercalated graphene

期刊

PHYSICAL REVIEW B
卷 105, 期 23, 页码 -

出版社

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.105.235307

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资金

  1. Japan Society for the Promotion of Science [18H03877, 20H05183, 19K15443, 21K14533, 19H01823]
  2. Murata Science Foundation [H30-084, H30-004]
  3. Asahi Glass Foundation
  4. Sumitomo Foundation
  5. Tokyo Tech Advanced Researchers (STAR)
  6. Nanotechnology Platform Program of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan [JPMXP09F20IT0008]
  7. MEXT Elements Strategy Initiative to Form Core Research Center through Tokodai Institute for Element Strategy [JPMXP0112101001]
  8. Tokyo Tech. Challenging Research Award

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We demonstrate a method to control the Fermi level around the Van Hove singularity (VHS) in Li-intercalated graphene on the SiC substrate. By observing a clear Lifshitz transition in the vicinity of the VHS when the thickness of graphene exceeds four layers, we calculate the band structure of a multilayer system with different stacking sequences of graphene and Li layer. Furthermore, a sizable Schottky barrier is formed between graphene and the substrate, allowing us to explore the electronic phase diagram around the VHS by controlling the thickness.
We demonstrate a method to control the Fermi level around the Van Hove singularity (VHS) in Li-intercalated graphene on the SiC substrate. By angle-resolved photoemission spectroscopy, we observed a clear Lifshitz transition in the vicinity of the VHS when the thickness of graphene exceeds four layers. We calculated the band structure of a multilayer system with different stacking sequences of graphene and Li layer. The so-called stage 2 model reproduces the Lifshitz transition, where Li occupies every other interlayer of graphene. In addition, we found that a sizable Schottky barrier is formed between graphene and the substrate. These properties allow us to explore the electronic phase diagram around the VHS by controlling the thickness.

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