期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 23, 期 -, 页码 219-227出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577515019074
关键词
polarization; scattering; RSoXS; PSoXS; resonant scattering; simulation
资金
- NSF [DMR-120-7032]
- US DOE [DE-AC02-05CH11231]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1207032] Funding Source: National Science Foundation
Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such examples of molecular alignment at domain interfaces and within the bulk of domains, which are both critical to fields such as organic electronics, are simulated and compared with experimental scattering. Anisotropic scattering patterns are found to allow unambiguous identification of the mechanism of local molecular orientation correlations and, as such, promise to be both distinct and complementary to isotropic scattering intensity as a general measure of thin film microstructure.
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