期刊
ACS APPLIED ELECTRONIC MATERIALS
卷 -, 期 -, 页码 -出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.2c00449
关键词
halide perovskite; X-ray diffraction; chemical vapor deposition; electrical transport; thermal stability
资金
- U.S. National Science Foundation (NSF) [DMR- 1807263]
- South African National Research Foundation [103621, 92520, 93212]
- Fulbright Research Scholar Program [DE-AC02-06CH11357]
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences
Methylammonium lead iodide thin films were successfully synthesized using chemical vapor deposition, and their structure and properties were investigated using X-ray diffraction and photoluminescence. The results showed that the films maintained a tetragonal structure in the temperature range of 20-300 K, displaying a single-phase behavior and uniform phase.
Methylammonium lead iodide (MAPbI3-xClx) thin films were synthesized using chemical vapor deposition. Temperature-dependent grazing incidence synchrotron-based X-ray diffraction measurements confirm that the structure of MAP-bI(3-x)Cl(x), where Cl acts more like a dopant, remains throughout in the tetragonal phase in the temperature range of 20-300 K. These studies are further correlated with temperature-dependent photo-luminescence (PL) studies. The PL peak energy monotonically increases with temperature, suggestive of a single-phase behavior. Resistance measurements conducted as a function of temperature show an absence of inflection points, suggesting uniformity in its phase. Between 200 and 325 K, the resistance remains a constant.
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