4.7 Article

Self-Unwrapping Phase-Shifting for Fast and Accurate 3-D Shape Measurement

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2022.3186705

关键词

Phase measurement; Shape measurement; Three-dimensional displays; Software engineering; Mathematical models; Indexes; Encoding; 3-D shape measurement; fringe projection profilometry; phase measurement profilometry (PMP); phase unwrapping; structured light

资金

  1. National Natural Science Foundation of China (NSFC) [62072190]
  2. Key Realm Research and Development Program of Guangzhou [202007030007]
  3. Program for Guangdong Introducing Innovative and Enterpreneurial Teams [2017ZT07X183]

向作者/读者索取更多资源

Phase unwrapping is a crucial step in 3-D phase measurement. Existing methods require additional information or assumptions, which affect measurement efficiency. To address this, we propose a self-unwrapping phase-shifting algorithm that retrieves absolute phase without external information, achieving higher efficiency and accuracy.
Phase unwrapping is one of the most important procedures in 3-D phase measurement profilometry (PMP) and has attracted great research interest in the past few decades. However, the existing phase unwrapping methods require additional patterns or preassumptions to determine the fringe orders for further absolute phase retrieval, which dramatically affect the measurement efficiency. To address this problem, we propose a generic self-unwrapping phase-shifting (SUPS) algorithm that retrieves the absolute phase without external information or priors. To this end, we first embed a novel space-varying phase shift (SPS) that uniquely determines the fringe order information into sinusoidal patterns, and then extract it to retrieve the absolute phase by pixelwise calculation. Our method achieves higher efficiency over previous methods while preserving the measurement precision, and the minimum number of patterns required is only four. All the theoretical, simulation, and extensive experimental results demonstrate its superiority in fast and accurate 3-D shape measurement.

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