期刊
JOURNAL OF MATERIALS CHEMISTRY C
卷 10, 期 37, 页码 13646-13675出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/d2tc02185d
关键词
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资金
- NingboTech University [20220322Z0059]
- Zhejiang Provincial Natural Science Foundation of China [LY22E020010]
The nanoscale morphology of the photoactive layer is crucial for the performance of solution-processed organic photovoltaics. In situ characterization methods provide insights into the drying kinetics of the photoactive layer, allowing for a deeper understanding of morphological evolution and guidance for optimizing film morphology.
The nanoscale morphology of the photoactive layer in solution-processed organic photovoltaics plays a critical role in device performance. Such an intricate morphology is sensitive to the processing conditions during film formation. From such a perspective, in situ characterizations stand out as they are able to provide insights for screening the film's transition from the solution state to the solid state. In this review, we summarize the state-of-the-art in situ characterization methods that are specifically designed to observe the drying kinetics of photoactive layers and discuss how they deepen our understanding of morphological evolution under different processing conditions. In particular, key factors such as the evolution of fine structure and interplay between solutes and solvents upon film formation could be revealed. We therefore use them as indicators to guide the future optimization of film morphology. We believe that a thorough understanding of morphological evolution, such as kinetics of crystallization and phase separation, through the above methodologies, can further push the efficiency of devices.
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