期刊
IEEE ACCESS
卷 4, 期 -, 页码 7716-7727出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2016.2585661
关键词
Electroencephalograms (EEG); epilepsy; discrete wavelet transform (DWT); naive Bayes (NB); k-nearest neighbor (k-NN)
Electroencephalogram (EEG) comprises valuable details related to the different physiological state of the brain. In this paper, a framework is offered for detecting the epileptic seizures from EEG data recorded from normal subjects and epileptic patients. This framework is based on a discrete wavelet transform (DWT) analysis of EEG signals using linear and nonlinear classifiers. The performance of the 14 different combinations of two-class epilepsy detection is studied using naive Bayes (NB) and k-nearest neighbor (k-NN) classifiers for the derived statistical features from DWT. It has been found that the NB classifier performs better and shows an accuracy of 100% for the individual and combined statistical features derived from the DWT values of normal eyes open and epileptic EEG data provided by the University of Bonn, Germany. It has been found that the computation time of NB classifier is lesser than k-NN to provide better accuracy. So, the detection of an epileptic seizure based on DWT statistical features using NB classifiers is more suitable in real time for a reliable, automatic epileptic seizure detection system to enhance the patient's care and the quality of life.
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