期刊
INDIAN JOURNAL OF PHYSICS
卷 -, 期 -, 页码 -出版社
INDIAN ASSOC CULTIVATION SCIENCE
DOI: 10.1007/s12648-022-02439-4
关键词
Si(100) surfaces; Pb thin films; Low-energy electron diffraction; Low-energy electron microscopy
资金
- Department of Atomic Energy (DAE), Government of India [XII-R DSIN-5.09-0102]
- CSIR, India
The initial stages of room temperature growth of Pb overlayers on commercial Si(100) p(2 x 1) surface have been investigated using low-energy electron diffraction and low-energy electron microscopy (LEEM) techniques. A well-ordered reconstructed Si(100) p(10 x 2) surface phase has been observed for 0.5 monolayers of Pb deposition and is found to vanish for higher Pb coverages. We do not observe any island formation in our LEEM studies during the early stages of growth, unlike earlier studies on low-miscut substrates. Our dark-field LEEM experiments suggest the observed high step density with low terrace widths is responsible for this behaviour.
The initial stages of room temperature growth of Pb overlayers on commercial Si(100) p(2 x 1) surface have been investigated using low-energy electron diffraction and low-energy electron microscopy (LEEM) techniques. A well-ordered reconstructed Si(100) p(10 x 2) surface phase has been observed for 0.5 monolayers of Pb deposition and is found to vanish for higher Pb coverages. We do not observe any island formation in our LEEM studies during the early stages of growth, unlike earlier studies on low-miscut substrates. Our dark-field LEEM experiments suggest the observed high step density with low terrace widths is responsible for this behaviour.
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