Highlight of polarization filtering effect in passive porous silicon ridge waveguides

Porous silicon is a material used in integrated optics with few studies on its structuration impact on the polarization in the near infra-red range. In this letter, we report optical characterizations around 1550 nm for different input polarization of porous silicon ridge waveguide used either as is or in a micro-resonator structure. We highlight a filtering of light polarization that attenuate transverse electric mode by observing the extinction of the resonance peaks during the transmission response of the micro-resonator based on passive porous silicon ridge waveguides.

Automated summary

In this letter, the authors investigate the impact of structuration on the polarization of porous silicon in the near infra-red range. They perform optical characterizations of porous silicon ridge waveguides with different input polarization at around 1550 nm, both as standalone structures and in micro-resonator configurations. The authors highlight the filtering effect of porous silicon, which attenuates the transverse electric mode.