3.8 Proceedings Paper

Tellurium doped a-Se devices for improved optical absorption in indirect X-ray photodetection

期刊

出版社

SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2613150

关键词

amorphous selenium; selenium photoconductors; selenium-tellurium; selenium indirect detectors; selenium doping; lateral device; X-ray detection; time of fight

资金

  1. DOE [DE-SC0021975]
  2. Western Digital Corporation
  3. NSF MRI grant [1126845]
  4. U.S. Department of Energy (DOE) [DE-SC0021975] Funding Source: U.S. Department of Energy (DOE)
  5. Direct For Mathematical & Physical Scien [1126845] Funding Source: National Science Foundation
  6. Division Of Materials Research [1126845] Funding Source: National Science Foundation

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This paper presents the initial steps towards improving the sensitivity and gain of a-Se indirect detectors by doping a-Se with tellurium and using a lateral device structure. The charge transport in doped a-Se/Te devices is studied using the transient photocurrent time-of-flight technique.
Amorphous selenium (a-Se) is a high gain, low dark current, large area compatible photoconductor that has received significant attention towards the development of UV and X-ray detectors for medical imaging Indirect detectors utilizing a-Se often feature blue emitting scintillators due to the high attenuation coefficient of a-Se in that region. However, emission tails from the scintillators often fall out of the conversion range of a-Se, and scintillators with emission peaks outside the absorption of Se cannot be utilized In order to improve the sensitivity and gain in a-Se indirect detectors, we propose doping a-Se with tellurium as a function of depth, where tail emission will be absorbed by the lower bandgap a-Se/Te after primary absorption in the initial Se layer. In addition, we employ a lateral device structure to avoid any absorption at short wavelengths from a transparent electrode or blocking layer. In this work, we present the first steps towards fabricating these devices. Studies of charge transport in doped a-Se/Te devices are performed using the transient photocurrent time-of-flight technique. We report hole and electron mobilities for a-Se1-x,Te-x (x = 0, 0.01, 0.05, 0.10) as a function of applied voltage, along with band gaps and comparisons to previous studies. Fabrication of lateral devices, with and without optical slits, is demonstrated and discussed.

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