4.6 Article

Highly Sensitive Band Alignment of the Graphene/MoSi2N4 Heterojunction via an External Electric Field

期刊

ACS APPLIED ELECTRONIC MATERIALS
卷 -, 期 -, 页码 -

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsaelm.2c00374

关键词

2D vdW heterojunction; electronic structure; band alignment; electric field; Schottky barrier

资金

  1. Outstanding Young and Middle-aged Science and Technology Innovation Team of Colleges and Universities in Hubei Provence [T201907]
  2. Outstanding Talent Foundation for Green Industry Leading Plan of HBUT [JCRC2021003]
  3. Science and Technology Research Project of Education Department of Hubei Province [Q20201402]

向作者/读者索取更多资源

The influence of interlayer spacing and external electric field on the GR/MoSi2N4 heterojunction was systematically investigated. The study found that both the type and height of the Schottky barrier can be tuned by altering the interlayer spacing or applying external electric field. These findings are of great importance for the design of next-generation field-effect transistors.
The combination of graphene (GR) and monolayer MoSi2N4 has attracted much attention; however, the comprehension of its electrical contact modulation is still not fully explored. Herein, the influence of the interlayer spacing and external electric field on the interfacial characteristic and electronic structure of the GR/MoSi2N4 heterojunction was systematically investigated using first-principles calculations. It is found that a stable van der Waals heterojunction forms when GR incorporates on the MoSi2N4 sheets. The results indicate that both the type and height of the Schottky barrier could be tuned by altering the interlayer spacing between GR and MoSi2N4 sheets or applying a vertical external electric field on the GR/MoSi2N4 heterojunction. Noteworthily, the Schottky barrier height markedly changes about 0.2-0.3 eV with the increase of external electric field per 0.1 V.A(-1). It is confirmed that the change of energy bands is caused by the charge redistribution with the interlayer spacing and external electric field. These findings will provide rational evidence for the design of next-generation field-effect transistors.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据