期刊
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
卷 -, 期 -, 页码 -出版社
IEEE
DOI: 10.1109/IRPS48227.2022.9764474
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This article demonstrates a resilient RRAM-based in-memory computing logic concept, showing strong resilience to RRAM variability even after numerous endurance cycles. The work achieves a new milestone in the field of RRAM in-memory logic and presents the first experimental evidence of an RRAM-based MLC 2-bit adder.
Crossbar arrays of resistive memories (RRAM) hold the promise of enabling In-Memory Computing (IMC), but essential challenges due to the impact of device imperfection and device endurance have yet to be overcome. In this work, we demonstrate experimentally an RRAM-based IMC logic concept with strong resilience to RRAM variability, even after one million endurance cycles. Our work relies on a generalization of the concept of in-memory Scouting Logic, and we demonstrate it experimentally with up to 16 parallel devices (operands), a new milestone for RRAM in-memory logic. Moreover, we combine IMC with Multi-Level-Cell programming and demonstrate experimentally, for the first time, an IMC RRAM-based MLC 2-bit adder.
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