Hall-Petch analysis for temperature and strain rate dependent deformation of polycrystalline lead

A dislocation pile-up analysis of the Hall-Petch constant k (epsilon) for the tensile deformation of polycrystalline lead over a wide range of temperature T and at two strain rates has been made. The predicted and experimental Hall-Petch dependencies k (epsilon) (2) = f (T) are in good agreement. Lower than predicted k (epsilon) values at very low temperatures are attributed to the high curvature of grain boundaries which experience high localized plasticity and consequent shear banding.