期刊
2022 IEEE 13TH LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
卷 -, 期 -, 页码 85-88出版社
IEEE
DOI: 10.1109/LASCAS53948.2022.9789069
关键词
current reference; subthreshold region; sensor fabrication; potentiostat; switch capacitor
This paper presents the design of an integrated circuit for electrochemical sensors, including a current reference circuit and a current readout circuit, and the performance of the circuits under specific process conditions was simulated and tested.
This paper presents the design of an integrated circuit (IC) for (i) electrochemical deposition of sensor layers on the on-chip pad openings to form sensing electrodes, and (ii) amperometric readout of electrochemical sensors. The IC consists of two main circuit blocks: a Beta-multiplier based current reference for galvanostatic electrodeposition, and a switch-capacitor based amperometric readout circuit. The circuits are designed and simulated in a 180-nm CMOS process. The reference circuit generates a stable current of 99 nA with a temperature coefficient of 141 ppm/degrees C at best and 170 ppm/degrees C on average (across corners) over a supply voltage range of 1.2-2.4 V, and a line regulation of 0.7 %/V. The readout circuit measures current within +/- 2 mu A with 99.9% linearity and a minimum integrated input-referred noise of 0.88 pA.
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