4.5 Article

Chip-Based Near-Field Terahertz Microscopy

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TTHZ.2016.2549358

关键词

Heterojunctions; nanosensors; scanning-probe microscopy; semiconductor devices

资金

  1. Japan Science and Technology Agency
  2. Canon Foundation
  3. Mitsubishi Foundation
  4. Funding Program for Next Generation World-Leading Researchers, MEXT/JSPS KAKENHI Grants [26286005, 26600010, 26103513, 26107516]
  5. Tokyotech Advanced Researchers (STAR)
  6. Grants-in-Aid for Scientific Research [26286005, 26103513, 26107516, 26600010] Funding Source: KAKEN

向作者/读者索取更多资源

Near-field terahertz (THz) imaging is vital to investigations in subwavelength regions down to the micro/nanometer scale. This technology is particularly useful for examining objects, such as nanomaterials, polymers, cells, and biomolecules. The first part of this paper briefly explains two types of near-field THz imaging technologies: aperture type and apertureless type. The second part explains our chip-based near-field imaging technology. We perform collection-mode near-field THz imaging by scanning an evanescently coupled THz detector closely across a sample surface. The implementation of a magnetically tunable THz detection method further enables us to obtain frequency-selective near-field THz images. As an application of this technology, cryogenic THz-emission imaging is presented, wherein THz radiation associated with electron injection into a semiconductor device is imaged with no THz pump source. This technique provides direct information about the spatial distribution of electrons injected from an electrode into a semiconductor channel.

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