期刊
IEEE JOURNAL OF PHOTOVOLTAICS
卷 6, 期 3, 页码 777-782出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2016.2540247
关键词
Electroluminescence (EL); luminescence; photovoltaic cells; radiation effects; space photovoltaics (PV); III-V semiconductor materials
资金
- KAKENHI from the Japan Society for the Promotion of Science [15H03968, 26610081, 26390075]
- Photon Frontier Network Program of the Ministry of Education, Culture, Sports, Science, and Technology
- JST-SENTAN
- JST-CREST in Japan
- China Scholarship Council
- Grants-in-Aid for Scientific Research [15H03968, 26390075] Funding Source: KAKEN
Via absolute electroluminescence measurements, we characterized degradations of internal luminescence quantum yield or internal radiative efficiency (eta(int) (i)) in respective subcells in GaInP/GaAs/Ge triple-junction and GaInP/GaAs double-junction solar cells after irradiations of protons and electrons with different energy and fluence (phi). Compared with typical open-circuit-voltage characterizations, eta(int i) turned out to be a sensitive, high-dynamic-range, quantitative, and fair indicator of radiation damage, since it purely represents material-quality change due to radiation damage, independently from small differences in bandgap energy due to alloy composition fluctuations and in other cell structures. A detailed fluence-dependence study has shown that the data of eta(int i) versus f in moderate and high f regions are very similar and almost independent of subcell materials, while the difference in beginning-of-life qualities of GaInP and GaAs materials causes dominant difference in subcell sensitivity to the low-radiation damages.
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