相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Extended Oxygen Octahedral Tilt Proximity near Oxide Heterostructures
Junsik Mun et al.
NANO LETTERS (2023)
Moire Fringe Method via Scanning Transmission Electron Microscopy
Xiaoxing Ke et al.
SMALL METHODS (2022)
High-precision atomic-scale strain mapping of nanoparticles from STEM images
Xiaonan Luo et al.
ULTRAMICROSCOPY (2022)
Micrometre-scale strain mapping of transistor arrays extracted from undersampled atomic-resolution images
Martin Couillard
MICRON (2021)
py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
Benjamin H. Savitzky et al.
MICROSCOPY AND MICROANALYSIS (2021)
Sampling optimization of Moire geometrical phase analysis for strain characterization in scanning transmission electron microscopy
A. Pofelski et al.
ULTRAMICROSCOPY (2020)
Scanning Moire Fringe Method: A Superior Approach to Perceive Defects, Interfaces, and Distortion in 2D Materials
Yung-Chang Lin et al.
ACS NANO (2020)
Deep Learning Enabled Strain Mapping of Single-Atom Defects in Two-Dimensional Transition Metal Dichalcogenides with Sub-Picometer Precision
Chia-Hao Lee et al.
NANO LETTERS (2020)
Array programming with NumPy
Charles R. Harris et al.
NATURE (2020)
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
V Prabhakara et al.
ULTRAMICROSCOPY (2020)
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Colin Ophus
MICROSCOPY AND MICROANALYSIS (2019)
Stress mapping of a strain superlattice using scanning moire fringe imaging
Huihui Wen et al.
APPLIED PHYSICS LETTERS (2018)
Evaluation of crystallographic strain, rotation and defects in functional oxides by the moire effect in scanning transmission electron microscopy
A. B. Naden et al.
NANOTECHNOLOGY (2018)
2D strain mapping using scanning transmission electron microscopy Moire interferometry and geometrical phase analysis
A. Pofelski et al.
ULTRAMICROSCOPY (2018)
The effect of scanning jitter on geometric phase analysis in STEM images
Jun Li et al.
ULTRAMICROSCOPY (2018)
STEM moire analysis for 2D strain measurements
Akimitsu Ishizuka et al.
MICROSCOPY (2017)
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping
Lewys Jones et al.
ULTRAMICROSCOPY (2017)
STEM moire analysis for 2D strain measurements
Akimitsu Ishizuka et al.
MICROSCOPY (2017)
Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting
Magnus Nord et al.
ADVANCED STRUCTURAL AND CHEMICAL IMAGING (2017)
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
David Cooper et al.
MICRON (2016)
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
A. De Backer et al.
ULTRAMICROSCOPY (2016)
Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction
David Cooper et al.
NANO LETTERS (2015)
Observing and measuring strain in nanostructures and devices with transmission electron microscopy
Martin J. Hytch et al.
MRS BULLETIN (2014)
Lattice and strain analysis of atomic resolution Z-contrast images based on template matching
Jian-Min Zuo et al.
ULTRAMICROSCOPY (2014)
Optimized imaging using non-rigid registration
Benjamin Berkels et al.
ULTRAMICROSCOPY (2014)
scikit-image: image processing in Python
Stefan van der Walt et al.
PEERJ (2014)
Interface lattice displacement measurement to 1 pm by geometric phase analysis on aberration-corrected HAADF STEM images
Yuanyuan Zhu et al.
ACTA MATERIALIA (2013)
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
Jean-Luc Rouviere et al.
APPLIED PHYSICS LETTERS (2013)
Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moire fringe imaging
Suhyun Kim et al.
JOURNAL OF APPLIED PHYSICS (2013)
Strain fields around dislocation arrays in a σ9 silicon bicrystal measured by scanning transmission electron microscopy
Martin Couillard et al.
PHILOSOPHICAL MAGAZINE (2013)
STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials
Vincenzo Grillo et al.
ULTRAMICROSCOPY (2013)
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy
David Cooper et al.
APPLIED PHYSICS LETTERS (2012)
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
Knut Mueller et al.
MICROSCOPY AND MICROANALYSIS (2012)
Correcting scanning instabilities from images of periodic structures
Nadi Braidy et al.
ULTRAMICROSCOPY (2012)
Dark-field electron holography for the measurement of geometric phase
M. J. Hytch et al.
ULTRAMICROSCOPY (2011)
Scanning moire fringe imaging by scanning transmission electron microscopy
Dong Su et al.
ULTRAMICROSCOPY (2010)
Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
David Cooper et al.
APPLIED PHYSICS LETTERS (2009)
Structural inhomogeneity and twinning in YBa2Cu3O7-δ superconductors:: High-resolution transmission electron microscopy measurements
Craig L. Johnson et al.
PHYSICAL REVIEW B (2008)
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Florian Huee et al.
PHYSICAL REVIEW LETTERS (2008)
The Peak Pairs algorithm for strain mapping from HRTEM images
Pedro L. Galindo et al.
ULTRAMICROSCOPY (2007)
On the accuracy of lattice-distortion analysis directly from high-resolution transmission electron micrographs
K Du et al.
JOURNAL OF MICROSCOPY (2006)
Theoretical discussions on the geometrical phase analysis
JL Rouvière et al.
ULTRAMICROSCOPY (2005)
Calibration of projector lens distortions
F Hue et al.
JOURNAL OF ELECTRON MICROSCOPY (2005)